liteScope™

LiteScope™It is a unique scanning probe microscope（SPM）. It is designed for easy integration into various scanning electron microscopes（SEM）In the middle. groupComplementary to each otherSPMandSEMTechnology enables it to leverage the advantages of both.useLiteScope™With its replaceable probe series, it can easily perform complex sample analysis, including characterization of surface morphology, mechanical properties, electrical properties, chemical composition, magnetic properties, etc.LiteScope™The design also allows it to be integrated with othersSEMAccessory combinationuseFocused ion beam（FIB）Or gas injection systeminterconnected system（GIS）Used for manufacturing nanomaterials/Microstructure and surface modification.In this combination,LiteScope™Can quickly and conveniently manufacture structures3Ddetection.In addition,LiteScope™Opened up a new field of measurement technology that enables the implementation of related microscopes, namely related probes and electron microscopes（CPEM）.CPEMTechnology is a pioneering technology in the market. It can be done in the same placeSPMandSEMmeasure，Meanwhile, use the same coordination system. onlyCPEMTechnology can bring youSPMandSEMAll advantages of technology related imaging.

characteristic

• LiteScope™EnhanceabilityabilityofSEMupgrade

• Can be used as a plugin for existing microscopes or as a new oneSEMsenduse

• Unique related probes and electronsMicroscope（CPEM）Technologyart

• Complex surface characterization-Appearance, roughness, magnetism, conductivity, electrical propertiesability

• Self sensing probe, no need for optical detection, no need for laser adjustment
  

• LiteScope™Easy to install toSEMOn the sample stage/Take from the sample tablego out

• compatibleFIB，GIS，EDXclassaccessory

• In a tilted position (angle)0°-60°），Minimum working distance5fine long hairrice

• The expandable measuring head can release the space around the sample

• There are various types of probes available on the marketMeasurement mode

• Quickly and easily replace the probe andsample

• User friendly software, operated in a web browser for easy remote access

• LiteScope™It can also be used as an independentSPMuse

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• Related probes and electron microscopes- CPEM

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LiteScope™It is existingSEMThe powerful enhancement function of the instrument's working mode. However, there is more to it.The related microscope combines the benefits of using two different techniques to image the same object.The correlation of data from individual images provides more detailed information about the sample, otherwise this information would be too complex to analyze.NenoVisionDeveloped unique technology-Related probes and electron microscopes (patent application pending)-Used for related imaging.CPEMCan pass throughSEMandSPMDetermine the surface characteristics of the sample areaSimultaneously using the same coordination systemUnified.






CPEMTechnology can provide standards in ways that have not yet been achievedSEMandSPMMethod for conducting relevant imaging.CPEMSynchronize the scanning area, resolution, and image distortion, and correlate the collected data in real-timeSPMandSEMimage.

Simultaneous scanning with known constant offset and the same resolution ensures analysis is performed on the same surface. You can use ourNenoViewThe software can directly view the generated images online.